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 |  |   This  paper continues computer  analysis of the un-indexed diffraction  patterns in the ICDD PDF-2 database. Diffraction data of 597 different Ni compositions were selected from the database  volumes №№1-50.
 Experimental and calculated interplanar  spacing and differences (dD = Dexp -  Dcal) are listed in tables, which are presented in this paper. Number of reflections  in a database cards was reduced to  12, which is sufficient to identify the  crystalline phase. Exceptions were in  the case of less number of reflections.  Selected crystal lattices,  in a few exceptions (low elevation),  meet the necessary condition abs  (dD) < (last sign Dexp), and  also the modern authenticity criteria.
   
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